一句话:首个基于大规模实证的 IoT 缺陷分类与开发挑战研究。
随着 IoT 系统在嵌入式系统到智能家居等领域迅速普及,开发者面临的缺陷与挑战却缺乏系统性的实践者视角研究。本文开展首个大规模实证调查:从 91 个代表性 IoT 项目仓库收集 5,565 份缺陷报告,按观察到的失败、根因和故障组件位置对随机抽样的 323 份进行分类;同时对 9 位 IoT 专家进行访谈,并问卷调研 194 位开发者以验证和补充发现。基于结果,作者提出首个 IoT 系统缺陷分类法,揭示高频缺陷类别及其根因、类别间关联,以及开发者常遇的陷阱与挑战,并为 IoT 领域后续研究与发展方向提出建议。
IoT systems are rapidly adopted in various domains, from embedded systems to smart homes. Despite their growing adoption and popularity, there has been no thorough study to understand IoT development challenges from the practitioners' point of view. We provide the first systematic study of bugs and challenges that IoT developers face in practice, through a large-scale empirical investigation. We collected 5,565 bug reports from 91 representative IoT project repositories and categorized a random sample of 323 based on the observed failures, root causes, and the locations of the faulty components. In addition, we conducted nine interviews with IoT experts to uncover more details about IoT bugs and to gain insight into IoT developers' challenges. Lastly, we surveyed 194 IoT developers to validate our findings and gain further insights. We propose the first bug taxonomy for IoT systems based on our results. We highlight frequent bug categories and their root causes, correlations between them, and common pitfalls and challenges that IoT developers face. We recommend future directions for IoT areas that require research and development attention.