一句话：通过工业案例研究揭示嵌入式系统集成测试中测试自动化的困难与局限。
现代嵌入式系统日益复杂，包含从板级支持包（BSP）、操作系统、中间件到感知、语音识别等 AI 算法的多个软件层。层间与层内的集成提供了拍照、视频流等专用服务，但也使系统故障的根因定位变得更加困难。本文以工业提案的形式，描述嵌入式系统测试所面临的困难，并围绕集成测试展开案例研究。作者并未提出新的测试技术或量化评估，而是通过实际案例说明测试自动化在嵌入式多层系统集成场景中的局限，为后续研究指出问题空间。
Modern embedded systems are increasingly complex and contain multiple software layers from BSP (Board Support Packages) to OS to middleware to AI (Artificial Intelligence) algorithms like perception and voice recognition. Integrations of inter-layer and intra-layer in embedded systems provide dedicated services such as taking a picture or movie-streaming. Accordingly, it gets more complicated to find out the root cause of a system failure. This industrial proposal describes a difficulty of testing embedded systems, and presents a case study in terms of integration testing.
DOI 原文 ·
@inproceedings{paperbot5193,
title = {Test Automation and Its Limitations: A Case Study},
author = {Ahyoung Sung and Sangjun Kim and Yangsu Kim and Younggun Jang and Jongin Kim},
booktitle = {ASE},
year = {2019},
doi = {10.1109/ase.2019.00139}
}