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P2 Turn up the heat!

把热度调高!
ICSE Proceedings of the ACM/IEEE 42nd International Conference on Software Engineering: Software Engineering Education and Training2020匹配度 2/10 · 该论文把统计故障定位(SFL)用于学生代码并生成可疑度热图以辅助调试,属于程序分析与调试工具方向,与我的 PL↔AI 交叉(LLM/Agent 与静态分析、形式化验证)无直接关联,也不涉及浮点程序分析或贝叶斯程序分析。其方法为动态谱分析而非静态分析,且与 LLM 无关,应用场景为编程教育。引用 7 inbox
Bob Edmison, Stephen H. Edwards
crossref: 2026-09-12

AI 速览

一句话:利用统计故障定位为学生代码生成可疑度热图,以可视化方式引导调试。

自动化评分系统通常只反馈测试失败或运行时错误,学生若缺乏调试技能,面对缺陷常不知从何入手。本文借鉴软件工程中的统计故障定位(SFL)技术,将其用于学生编程作业:先计算代码每一行与缺陷相关的“可疑度”分数,再把该分数以热图形式叠加到源代码上。这样,学生能在不过度依赖直接答案的情况下,将注意力集中到最可能出问题的代码区域,获得调试脚手架,降低排查缺陷的摸索成本。摘要未报告具体实验评估结果。

问题
自动化评分只指出错误行为,缺少对学生调试过程的引导,导致学生难以定位和修复缺陷。
方法
采用软件工程中的统计故障定位(SFL)计算每行代码的可疑度,并生成叠加在源代码上的热图可视化。
评估
摘要未给出具体实验评估;目标是通过可疑度热图为学生提供适度脚手架,引导其关注最可能出错的代码。
原文摘要(Abstract)

Automated grading systems provide feedback to students in a variety of ways, but they typically focus on identifying incorrect program behaviors. Such systems provide notices of test case failures or runtime errors, but without debugging skills, students often become frustrated when they don't know where to start addressing these defects. Borrowing from work in software engineering research related to automated defect location, we leverage previous research describes using statistical fault localization (SFL) techniques to identify the probable locations of defects in student coding assignments. The goal is to use these SFL techniques to provide a scaffold for students, to direct their debugging efforts without giving too much guidance, and thus minimizing the learning associated with investigating the defects. After determining the "suspiciousness" for each line of code involved in the defect, we create a "heat map" visualization overlay onto their source code of the "suspiciousness" scores to visually guide a student's attention to parts of their code that are most likely to contain problems.

链接与引用

DOI 原文 ·

BibTeX
@inproceedings{paperbot5685,
  title = {Turn up the heat!},
  author = {Bob Edmison and Stephen H. Edwards},
  booktitle = {ICSE},
  year = {2020},
  doi = {10.1145/3377814.3381707}
}