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P2 An Empirical Study on Concurrency Bugs in Interrupt-Driven Embedded Software

中断驱动嵌入式软件中并发缺陷的实证研究
ISSTA Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis2023匹配度 4/10 · 该论文是工业中断驱动嵌入式软件中并发缺陷的实证研究,与程序分析和缺陷检测有一定间接关联,但不涉及用户核心关注的 LLM/Agent、浮点程序分析或贝叶斯程序分析。引用 17 inbox
Chao Li, Rui Chen, Boxiang Wang, Zhixuan Wang, Tingting Yu, Yunsong Jiang, Bin Gu, Mengfei Yang
crossref: 2026-09-12dblp: 2026-09-12

AI 速览

一句话:首次大规模实证分析工业中断驱动嵌入式软件中的132个真实并发缺陷,总结其根因、影响、修复与表现形式。

中断驱动嵌入式软件广泛用于航空航天、汽车电子、医疗设备与物联网等领域,其中断交错执行的不确定性会引发并发缺陷,导致任务失败或严重安全问题。然而,工业实践中此类缺陷的真实特征尚缺乏系统认识。本文开展首个面向工业中断驱动嵌入式软件的大规模并发缺陷实证研究,严格分析102个工业软件中的132个真实并发缺陷,考察其根因、影响与修复策略,并刻画触发范围、竞争变量、访问交错模式和变量关联等表现形式。研究揭示若干重要发现,可指导未来面向该领域的并发缺陷检测、测试与修复技术及工具研发。

问题
中断驱动嵌入式软件中不确定的中断交错可能引发并发缺陷,造成任务失败与安全问题,但工业场景下真实并发缺陷的特征尚不清晰。
方法
对102个工业中断驱动嵌入式软件中的132个真实并发缺陷进行大规模实证分析,统计并归纳其根因、影响、修复策略及触发范围、竞争变量、访问交错模式和变量关联等表现形式。
评估
通过人工严格分析真实工业缺陷数据,总结出若干重要发现,为后续并发缺陷检测、测试与修复技术提供指导。
原文摘要(Abstract)

Interrupt-driven embedded software is widely used in aerospace, automotive electronics, medical equipment, IoT, and other industrial fields. This type of software is usually programmed with interrupts to interact with hardware and respond to external stimuli on time. However, uncertain interleaving execution of interrupts may cause concurrency bugs, resulting in task failure or serious safety issues. A deep understanding of real-world concurrency bugs in embedded software will significantly improve the ability of techniques in combating concurrency bugs, such as bug detection, testing and fixing. This paper performs the first comprehensive and large-scale empirical study on concurrency bugs in industrial interrupt-driven embedded software. A total number of 132 real-world concurrency bugs in 102 industrial embedded software have been rigorously analyzed. Not only have the root causes, impacts and fix strategies of bugs been studied, but also the manifestation, including triggering scopes, racing variables, access interleaving patterns, and variables correlations. This study reveals several significant findings, which can guide future research in developing techniques and tools to combat concurrency bugs for interrupt-driven embedded software.

链接与引用

DOI 原文 · PDF(开放获取) · DBLP

BibTeX
@inproceedings{LiCWWYJ0Y23,
  title = {An Empirical Study on Concurrency Bugs in Interrupt-Driven Embedded Software},
  author = {Chao Li and Rui Chen and Boxiang Wang and Zhixuan Wang and Tingting Yu and Yunsong Jiang and Bin Gu and Mengfei Yang},
  booktitle = {ISSTA},
  year = {2023},
  doi = {10.1145/3597926.3598140}
}