Fault localization (FL) can identify the fault's location by analyzing the execution information from test cases in the program. This execution information serves as the foundation for FL to infer latent causal relationships between fault entities and failed results. However, this execution information contains coincidental correctness (CC), which reduces the accuracy of FL. CC arises when a test case executes faulty program entities but still produces the correct output, leading to misleading FL inferences. In widely used datasets, the presence of CC compromises the reliability of passed test cases (i.e., negative labels). In contrast, failed test cases (i.e., positive labels) remain definitive. In FL scenarios, unlabeled data is typically abundant and primarily consists of passed test cases. Therefore, systematically leveraging positive and unlabeled data for accurate CC detection is essential, which is beneficial to FL. To tackle the problem, we propose a two-stagE positiVe and unlAbeled learning model for coiNcidental correctneSs detection, EVANS. EVANS defines failed test cases as positive samples and treats the remaining ones as unlabeled data. It comprises two core modules: (1) A module for selecting high-quality pseudo-negative samples. This module leverages vector distance metrics to identify high-quality pseudo-negative test cases, using inter-class distances computed via a pre-trained model. (2) A weakly supervised contrastive learning module. This module utilizes the labeled samples from Stage (1) to train a contrastive learning model, which then detects CC in unlabeled test cases. Experimental results demonstrate that EVANS significantly outperforms current CC detection methods.

@inproceedings{paperbot9274,
  title = {Sifting Truth from Coincidences: A Two-Stage Positive and Unlabeled Learning Model for Coincidental Correctness Detection},
  author = {Chunyan Liu and Huan Xie and Yan Lei and Zhenyu Wu and Jinping Wang},
  booktitle = {ASE},
  year = {2025},
  doi = {10.1109/ase63991.2025.00127}
}